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公开(公告)号:US11937983B2
公开(公告)日:2024-03-26
申请号:US18141450
申请日:2023-04-30
Applicant: BFLY Operations, Inc.
Inventor: David Elgena , Matthew De Jong , Cristina Shin
CPC classification number: A61B8/465 , A61B8/08 , A61B8/5207 , A61B8/5223
Abstract: Aspects of the technology described herein include a processing device configured to display, on a touch-sensitive display screen of a processing device in operative communication with an ultrasound device, an ultrasound image, a movable measurement tool, and an icon that maintains a fixed distance from a portion of the measurement tool. The icon may be configured to modify the measurement tool, and the icon may not overlap the measurement tool.
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公开(公告)号:US20240225605A1
公开(公告)日:2024-07-11
申请号:US18614455
申请日:2024-03-22
Applicant: BFLY Operations, Inc.
Inventor: David Elgena , Matthew De Jong , Cristina Shin
CPC classification number: A61B8/465 , A61B8/08 , A61B8/5207 , A61B8/5223
Abstract: Aspects of the technology described herein include a processing device configured to display, on a touch-sensitive display screen of a processing device in operative communication with an ultrasound device, an ultrasound image, a movable measurement tool, and an icon that maintains a fixed distance from a portion of the measurement tool. The icon may be configured to modify the measurement tool, and the icon may not overlap the measurement tool.
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公开(公告)号:US20230329676A1
公开(公告)日:2023-10-19
申请号:US18141450
申请日:2023-04-30
Applicant: BFLY Operations, Inc.
Inventor: David Elgena , Matthew De Jong , Cristina Shin
CPC classification number: A61B8/465 , A61B8/08 , A61B8/5207 , A61B8/5223
Abstract: Aspects of the technology described herein include a processing device configured to display, on a touch-sensitive display screen of a processing device in operative communication with an ultrasound device, an ultrasound image, a movable measurement tool, and an icon that maintains a fixed distance from a portion of the measurement tool. The icon may be configured to modify the measurement tool, and the icon may not overlap the measurement tool.
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