公开(公告)号：US20190049487A1

公开(公告)日：2019-02-14

申请号：US15964781

申请日：2018-04-27

申请人： BOE Technology Group co., Ltd. ,  Hefei Xinsheng Optoelectronics Technology Co., Ltd

发明人： Kai Qiao ,  Han Chen ,  Peihuan Ning ,  Shilin Zhu ,  Wei Sun ,  Bin Wan ,  Weiquan Zeng ,  Zhuoyan Ni

IPC分类号： G01R1/04 ,  G01R31/04

摘要： An electrical testing jig includes: a substrate; a first bracket on the substrate, the first bracket having a first step extending in a first direction on a top of the first bracket; and a second bracket on the substrate, the second bracket being spaced apart from the first bracket in a second direction perpendicular to the first direction and having two second steps spaced apart from each other in the first direction on a top of the second bracket. Each of the second steps is angular.

公开(公告)号：US10901000B2

公开(公告)日：2021-01-26

申请号：US15964781

申请日：2018-04-27

申请人： BOE Technology Group Co., Ltd. ,  Hefei Xinsheng Optoelectronics Technology Co., Ltd.

发明人： Kai Qiao ,  Han Chen ,  Peihuan Ning ,  Shilin Zhu ,  Wei Sun ,  Bin Wan ,  Weiquan Zeng ,  Zhuoyan Ni

IPC分类号： G01R1/04 ,  G01R31/69

摘要： An electrical testing jig includes: a substrate; a first bracket on the substrate, the first bracket having a first step extending in a first direction on a top of the first bracket; and a second bracket on the substrate, the second bracket being spaced apart from the first bracket in a second direction perpendicular to the first direction and having two second steps spaced apart from each other in the first direction on a top of the second bracket. Each of the second steps is angular.