公开(公告)号：US20230381826A1

公开(公告)日：2023-11-30

申请号：US17825497

申请日：2022-05-26

Applicant: Badger Meter, Inc.

Inventor： Henry Voigt ,  Christoph Wagner

IPC: B08B1/00 ,  G01N21/31 ,  B08B5/02

CPC classification number: B08B1/005 ,  G01N21/31 ,  B08B1/008 ,  B08B5/02 ,  B08B1/007

Abstract: A cleaning system can be used for cleaning the emitting and receiving units in a measurement section of a spectrometer probe. The cleaning system includes a cleaning instrument including a blade, cleaning lamellas extend outward from the blade, a cleaning instrument actuator including a piston imparting linear motion to the cleaning instrument during a cleaning operation and an attachment adapter configured to attach the cleaning instrument actuator to the spectrometer probe at a flow cell window aperture. The adapter includes an adapter body to receive and allow through passage of the cleaning instrument when it is attached to cleaning instrument actuator and to position the cleaning instrument relative to a measurement section between emitting and receiving units of the spectrometer probe.