公开(公告)号：US11662271B1

公开(公告)日：2023-05-30

申请号：US17971051

申请日：2022-10-21

Applicant: Beijing Institute of Technology

Inventor： Mingming Dong ,  Yitong Wang ,  Yue Bian ,  Shen Lu ,  Xiang Ji

IPC: G01M17/007

CPC classification number: G01M17/007

Abstract: The road simulation device includes a frame structure and a transmission structure. The transmission structure includes a first test bench, a second test bench, a third test bench and a fourth test bench. A first sliding plate structure of the first test bench slides in a first direction and a second direction, a second sliding plate structure of the second test bench slides in the first direction, and a third sliding plate structure of the third test bench slides in the second direction. The first sliding plate structure and the first base structure, the second sliding plate structure and the second base structure, the third sliding plate structure and the third base structure, as well as the fourth baffle plate structure and the fourth base structure are connected by spherical hinges. Damages to the frame structure caused by huge acting force generated by rigid connection during testing can be avoided.

公开(公告)号：US20230175927A1

公开(公告)日：2023-06-08

申请号：US17971051

申请日：2022-10-21

Applicant: Beijing Institute of Technology

Inventor： Mingming Dong ,  Yitong Wang ,  Yue Bian ,  Shen Lu ,  Xiang Ji

IPC: G01M17/007

CPC classification number: G01M17/007

Abstract: The road simulation device includes a frame structure and a transmission structure. The transmission structure includes a first test bench, a second test bench, a third test bench and a fourth test bench. A first sliding plate structure of the first test bench slides in a first direction and a second direction, a second sliding plate structure of the second test bench slides in the first direction, and a third sliding plate structure of the third test bench slides in the second direction. The first sliding plate structure and the first base structure, the second sliding plate structure and the second base structure, the third sliding plate structure and the third base structure, as well as the fourth baffle plate structure and the fourth base structure are connected by spherical hinges. Damages to the frame structure caused by huge acting force generated by rigid connection during testing can be avoided.