公开(公告)号：US12174152B2

公开(公告)日：2024-12-24

申请号：US17112879

申请日：2020-12-04

Applicant: Bell Textron Inc.

Inventor： Corbin Tod Freitag

IPC: G01N3/08

Abstract: A test apparatus includes a first grip, a second grip movable relative to the first grip, a test specimen disposed to provide a load path between the first grip and the second grip, and a test chamber disposed to both substantially envelope the test specimen and move with one of the first grip and the second grip. The test chamber does not contact the test specimen. Another test apparatus includes, a first grip, a second grip movable relative to the first grip, a test specimen disposed to provide a load path between the first grip and the second grip, a first test chamber disposed to both substantially envelope the test specimen and move with one of the first grip and the second grip, and a second test chamber disposed to both substantially envelope both the test specimen and the first test chamber.

公开(公告)号：US20220178801A1

公开(公告)日：2022-06-09

申请号：US17112879

申请日：2020-12-04

Applicant: Bell Textron Inc.

Inventor： Corbin Tod Freitag

IPC: G01N3/08

Abstract: A test apparatus includes a first grip, a second grip movable relative to the first grip, a test specimen disposed to provide a load path between the first grip and the second grip, and a test chamber disposed to both substantially envelope the test specimen and move with one of the first grip and the second grip. The test chamber does not contact the test specimen. Another test apparatus includes, a first grip, a second grip movable relative to the first grip, a test specimen disposed to provide a load path between the first grip and the second grip, a first test chamber disposed to both substantially envelope the test specimen and move with one of the first grip and the second grip, and a second test chamber disposed to both substantially envelope both the test specimen and the first test chamber.