High temperature heating system
    1.
    发明授权

    公开(公告)号:US10241017B2

    公开(公告)日:2019-03-26

    申请号:US14361094

    申请日:2012-11-28

    申请人: Bruker Nano, Inc.

    摘要: A sample gripping and heating assembly includes an assembly housing and first and second heating grips coupled with the assembly housing. The first and second heating grips each include a gripping surface, and the gripping surfaces of the first and second heating grips are opposed to each other. Each of the first and second heating grips further includes a heating element adjacent to the gripping surface. Optionally, the sample gripping and heating assembly is included in a heating system including a probe heater having a probe heating element for heating of a probe. The heating system is included with a testing assembly having a stage coupled with the sample gripping and heating assembly, and a transducer assembly coupled with the probe heater.