Method and system for automated debugging of a device under test

    公开(公告)号:US09928328B1

    公开(公告)日:2018-03-27

    申请号:US15164514

    申请日:2016-05-25

    CPC classification number: G06F17/5045 G06F17/505

    Abstract: A method for automated debugging of a design under test (DUT), including using a processor, (a) identifying a value of a signal at a specific time instance in which a user has indicated interest; (b) performing driver tracing based on structural analysis and signal analysis to determine one or a plurality of drivers of the identified value in the signal; (c) if the driver tracing returns a single driver of said one or a plurality of drivers, presenting the returned single driver to the user via an output device; and (d) if the driver tracing returns a plurality of drivers of said one or a plurality of drivers, performing formal analysis on a compiled sub-structure of the DUT to which all of said returned plurality of drivers are related to determine a single driver from said returned plurality of drivers, and presenting the determined single driver from said returned plurality of drivers to the user via the output device.

Patent Agency Ranking