公开(公告)号：US20240159528A1

公开(公告)日：2024-05-16

申请号：US18548682

申请日：2021-12-22

Applicant: CHOTEST TECHNOLOGY INC.

Inventor： Zhiwei Zhang ,  Yuan Chen ,  Hejun Zhang ,  Furong Feng ,  Xuewen Liao ,  Longjun Cheng

IPC: G01B21/22 ,  G01B21/04

CPC classification number: G01B21/22 ,  G01B21/04

Abstract: Some embodiments of the disclosure provide a method for measuring orthogonality of an orthogonal axis system, In some examples, the method includes following steps: placing an instrument on a bearing surface, intercepting a second rotary axis along an interception plane to obtain a first virtual cross section of the second rotary axis, and measuring the first virtual cross section to obtain a geometric center of the first virtual cross section as a first position; rotating a first rotary device to enable the second rotary axis to rotate with a preset angular degree, and measuring the second virtual cross section to obtain a geometric center of the second virtual cross section as a second position; and determining whether the orthogonality between the first rotary axis and the second rotary axis meets requirements or not on the basis of the first position and the second position.