公开(公告)号：US20230186458A1

公开(公告)日：2023-06-15

申请号：US18107019

申请日：2023-02-08

Applicant: CKD CORPORATION

Inventor： Naohiro Zaima ,  Kazuyoshi Kikuchi ,  Tsuyoshi Ohyama ,  Norihiko Sakaida

IPC: G06T7/00 ,  G06T15/50 ,  G06T9/00 ,  G06V10/141 ,  G06V10/74 ,  G06V10/82

CPC classification number: G06T7/0008 ,  G06T15/506 ,  G06T9/00 ,  G06T7/001 ,  G06V10/141 ,  G06V10/761 ,  G06V10/82 ,  G06T2207/30141 ,  G06T2207/30152

Abstract: A substrate foreign matter inspection device includes: an image data obtaining device that obtains image data of a target inspection area in the printed circuit board including a printed portion of the solder paste; a storage that stores a neural network and a model, the model being generated by learning of the neural network that includes an encoding portion and a decoding portion by using, as learning data, only image data of the target inspection area that do not include any foreign matter; and a control device that obtains reconfigured image data by inputting original image data obtained by the image data obtaining device into the model, compares the original image data with the reconfigured image data, and determines whether any foreign matter is present or absent on the printed circuit board based on a result of comparison with the reconfigured image data.