专利检索 ap:("COMPAGNIE GENERALE DES ESTABLISSEMENTS MICHELIN" OR "MICHELIN RECHERCHE ET TECHNIQUE S.A.") AND inv:"Cédric Goeau" 第 1 页

1.

发明授权
Method for measuring the thickness of a layer of rubber-like material 有权

公开(公告)号：US10190863B2

公开(公告)日：2019-01-29

申请号：US15535138

申请日：2015-12-11

申请人： COMPAGNIE GENERALE DES ESTABLISSEMENTS MICHELIN , MICHELIN RECHERCHE ET TECHNIQUE S.A.

发明人： Thomas Ledoux , Denis Martin , Alexandre Pernot , Guillaume Heredia , Patrick Meneroud , Cédric Goeau

IPC分类号： G01M17/02 , G01B7/06 , G01N27/72 , G01R33/12

摘要： A method is provided for measuring a thickness of a layer of rubber-like material. The layer of rubber-like material includes a free face in contact with air and a face joined to an adjacent reinforcement made of elements electrically insulated from one another. Each of the elements includes at least one hysteretic material having a magnetic permeability greater than the magnetic permeability of air. According to the method, a sensitive element, which emits an alternating magnetic field, is brought towards the layer of rubber-like material whose thickness is to be measured, hysteretic losses in the adjacent reinforcement are measured at terminals of the sensitive element, and a thickness of the layer of rubber-like material is evaluated based on the hysteretic losses.