公开(公告)号：US20230419472A1

公开(公告)日：2023-12-28

申请号：US18465557

申请日：2023-09-12

Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED

Inventor： Maolong Niu ,  Qiangwei Huang ,  Jintan Xie ,  Yongfa Liu

IPC: G06T7/00 ,  G06T7/11

CPC classification number: G06T7/0004 ,  G06T7/11 ,  G06T2207/20021 ,  G06T2207/20084 ,  G06T2207/30108

Abstract: A defect detection method includes: obtaining an average grayscale value of an image; constructing a mapping table, where elements of the mapping table include a mapped value corresponding to each grayscale value within a grayscale value range of the image, a mapped value corresponding to a grayscale value greater than or equal to a reference value is a first value, a mapped value corresponding to a grayscale value less than the reference value is a second value, and the reference value is an absolute value of a difference between the average grayscale value and a preset grayscale value; searching for a mapped value corresponding to a grayscale value of each pixel in the image from the mapping table; segmenting the image to obtain a suspicious defect sub-image based on the mapped value corresponding to the grayscale value of each pixel; and inputting the suspicious defect sub-image into a machine learning model.