SYSTEM AND METHOD FOR DISPLAY TEST
    1.
    发明申请
    SYSTEM AND METHOD FOR DISPLAY TEST 有权
    用于显示测试的系统和方法

    公开(公告)号:US20080061815A1

    公开(公告)日:2008-03-13

    申请号:US11862142

    申请日:2007-09-26

    IPC分类号: G01R31/00

    CPC分类号: G09G3/006 G09G3/3648

    摘要: The system for display test includes a driving circuit having integrated circuit (IC) pads on the substrate and the IC pads are electrically connected to the signal lines, respectively. And the first switches are between the first test pads and the IC pads, wherein the number of the first test pads is less than the number of the IC pads.

    摘要翻译: 用于显示测试的系统包括在基板上具有集成电路(IC)焊盘的驱动电路,并且IC焊盘分别电连接到信号线。 并且第一开关位于第一测试焊盘和IC焊盘之间,其中第一测试焊盘的数量小于IC焊盘的数量。