Programmable non-volatile semiconductor memory device
    1.
    发明授权
    Programmable non-volatile semiconductor memory device 有权
    可编程非易失性半导体存储器件

    公开(公告)号:US07102910B2

    公开(公告)日:2006-09-05

    申请号:US10536914

    申请日:2003-10-31

    IPC分类号: G11C11/00

    CPC分类号: G11C17/18 G11C17/16

    摘要: The present invention relates to a programmable non-volatile semiconductor memory device comprising a matrix of rows and columns of memory cells (1). To reduce the required memory area a 3T memory cell is proposed comprising a bridge of two bridge transistors (MN0, MN1), preferably NMOS transistors, a read transistor, preferably an PMOS transistor, and a silicided polysilicium fuse resistor (R). The read transistors enable the use of a single sense line (SL) for all memory cells (1) of the same row or column in the matrix thus enabling the use of a common sense amplifier for sensing memory cells (1).

    摘要翻译: 本发明涉及包括存储单元(1)的行和列的矩阵的可编程非易失性半导体存储器件。 为了减少所需的存储区域,提出了一种3T存储单元,其包括两个桥式晶体管(MN 0,MN 1),优选NMOS晶体管,读取晶体管,优选PMOS晶体管和硅化聚硅熔丝电阻(R)的桥。 读取晶体管使得能够对矩阵中相同行或列的所有存储单元(1)使用单个感测线(SL),从而能够使用用于感测存储器单元(1)的公共读出放大器。