公开(公告)号：US06662133B2

公开(公告)日：2003-12-09

申请号：US09798291

申请日：2001-03-01

申请人： Christopher John Engel ,  Norman Karl James ,  Brian Chan Monwai ,  Kevin F. Reick ,  Philip George Shephard, III ,  Marco Zamora

发明人： Christopher John Engel ,  Norman Karl James ,  Brian Chan Monwai ,  Kevin F. Reick ,  Philip George Shephard, III ,  Marco Zamora

IPC分类号： G06F11277

CPC分类号： G06F11/2236

摘要： Repairing arrays on a processor with an on chip built in self test engine on the processor is provided. A subset of the arrays is selected for testing. Data patterns are sent from the test engine to the subset of arrays at a plurality of operating parameters. A response is received at the test engine from the subset of arrays at the operating parameters. The received response is compared to an expected response using the test engine, wherein the processor controller determines if additional test failures were detected by the test engine for the subset of arrays with a plurality of JTAG based instructions. Code in the processor controller then determines the states that need to be scanned into the scannable latches to force the array control logic to choose additional spare wordlines and/or bitlines to repair the newly identified failures in addition to all previously defined repair actions.

摘要翻译： 提供了在处理器上修复阵列，内置了处理器内置的自检引擎。 选择一组数组进行测试。 数据模式在多个操作参数下从测试引擎发送到阵列子集。 在测试引擎处从操作参数的阵列子集接收到响应。 将接收到的响应与使用测试引擎的预期响应进行比较，其中处理器控制器确定测试引擎是否针对具有多个基于JTAG的指令的阵列子集检测到附加测试失败。 然后，处理器控制器中的代码确定需要扫描到可扫描锁存器中的状态，以强制阵列控制逻辑选择额外的备用字线和/或位线，以修复除了所有先前定义的修复动作之外的新识别的故障。

公开(公告)号：US11009333B1

公开(公告)日：2021-05-18

申请号：US16710858

申请日：2019-12-11

申请人： Marco Zamora

发明人： Marco Zamora

IPC分类号： G01B3/56

摘要： A taper gauge assembly includes a plurality of gauges that each has a flat side and a tapered side. Each of the gauges has ruler indicia printed thereon for indicating the width of the gauges along a full length of the gauges. A selected one of the gauges is insertable into a gap between a reference fixture and an assembled part in a manufacturing setting. Moreover, the selected gauge is inserted downwardly until the flat side abuts a perimeter edge of the reference fixture and the tapered side abuts a perimeter edge of the assembled part. Thus, the perimeter edge the reference fixture and the perimeter edge of the assembled part is aligned with a respective point along the ruler indicia. In this way an inspection distance is defined between the reference fixture and the assembled part for performing a quality inspection.