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公开(公告)号:US5426862A
公开(公告)日:1995-06-27
申请号:US235687
申请日:1994-04-29
申请人: Chung-sik Ham , Jong-duk Kim , Ho-sung Lee
发明人: Chung-sik Ham , Jong-duk Kim , Ho-sung Lee
摘要: A panel testing apparatus for measuring the curvature of an inner surface, the thickness of an edge portion, and the thickness of a center portion of the panel comprises a lifting device for accepting and transporting the panel to a testing position, and a panel supporting device for maintaining the panel in a predetermined position during testing. The apparatus comprises a panel inner curvature measuring device, edge thickness measuring device, and a center thickness measuring device, each of which using one or more linear variable differential transformers for the purpose of providing panel measurement data. The apparatus further comprises a studpin leveling device for measuring the burial depth of studpins within the panel and simultaneously leveling the studpins to the same height, and a studpin position measuring device for measuring the horizontal and/or vertical placement of the studpins within the panel, each of which using one or more linear variable differential transformers for the purpose of providing studpin measurement data.
摘要翻译: 用于测量内表面的曲率,边缘部分的厚度和面板的中心部分的厚度的面板测试装置包括用于接收并将面板运送到测试位置的提升装置,以及面板支撑装置 用于在测试期间将面板保持在预定位置。 该装置包括面板内曲率测量装置,边缘厚度测量装置和中心厚度测量装置,每个测量装置使用一个或多个线性可变差动变压器来提供面板测量数据。 该装置还包括一个支柱平整装置,用于测量面板内的螺柱的埋藏深度并同时将螺柱平整到相同的高度;以及支柱位置测量装置,用于测量工具头在面板内的水平和/或垂直放置, 每个都使用一个或多个线性可变差动变压器,以提供支柱测量数据。