公开(公告)号：US20180128740A1

公开(公告)日：2018-05-10

申请号：US15520444

申请日：2015-10-20

Applicant: Cibite AG

Inventor： Dieter OLSCHEWSKI ,  Ina DÖHRING ,  Peter LÜKE

IPC: G01N21/59 ,  G01N21/896

CPC classification number: G01N21/59 ,  G01N21/896 ,  G01N2021/8416 ,  G01N2201/06126

Abstract: The invention relates to a method and an associated device for determining the transmittance of a flat-glass substrate (40) with a measuring device (10), with which light of at least one light source (20) is guided from one side of the flat-glass substrate (40) through the flat-glass substrate (40) to the opposite side of the flat-glass substrate (40), where it is captured by at least one receiving unit (30) and the transmittance of the flat-glass substrate (40) is determined by means of a comparison between the intensity of the light emitted by the light source (20) and the light incident upon the receiving unit (30). The light source is a surface-like diffuse light source (20), and the receiving unit (30) comprises at least one spatially resolving receiver (31; 31n). By evaluating brightness values in the measuring image (33; 33′) of the spatially resolving receiver (31; 31n), the transmittance is determined in a spatially resolved manner in a partial surface of the flat-glass substrate (40), which is covered by the measuring image (33; 33′).

公开(公告)号：US20180266966A1

公开(公告)日：2018-09-20

申请号：US15520447

申请日：2015-10-21

Applicant: Cibite AG

Inventor： Dieter OLSCHEWSKI ,  Ina DÖHRING ,  Peter LÜKE

IPC: G01N21/896 ,  G01N21/59

CPC classification number: G01N21/896 ,  G01N21/59 ,  G01N2021/8416

Abstract: The invention relates to a method and an associated device for verifying the transmittance of a flat-glass substrate (40) with a measuring device (10), with which light of at least one light source (20) is guided from one side of the flat-glass substrate (40) through the flat-glass substrate (40) to the opposite side of the flat-glass substrate (40), where it is captured by at least one receiving unit (30) and the transmittance of the flat-glass substrate (40) is determined by means of a comparison between the intensity of the light emitted by the light source (20) and the light incident upon the receiving unit (30). In a first measurement, a light source (20) generates polychromatic light in the process, wherein the transmittance is determined at a point of the flat-glass substrate (40), and in at least one further measurement, a light source (20) generates monochromatic light of a defined wavelength, the transmittance also being determined at the same point of the flat-glass substrate (40), if possible. By comparing the at least two measurements, it is determined whether the transmittance is approximately the same or not the same in all measurements, in order thus to be able to better narrow down the cause for a reduced transmittance.