摘要:
Techniques for detecting defects in the proximity of a hole of a laminate structure include inserting a generally cylindrical body portion into a hole such that a first coil of wire will reside in a plane substantially parallel to a first electrically conductive layer of the laminate material. A magnetic field produced by the first coil of wire will produce eddy-currents in the conductive layer in the plane of the first conductive layer, but damaged laminate materials will fail to produce similar eddy-currents. As the differences in eddy-currents between damages and undamaged laminate layers can be measured, damage to such laminate materials can be determined.
摘要:
The apparatus and method for moving a sensor over a workpiece includes a sensor, and an actuating member. The sensor, such as a non-destructive test sensor, is carried by the actuating member, and the actuating member is at least partially disposed within a housing. The actuating member is adapted for automated movement in one direction, and the housing may be configured to be grasped by an operator and manually moved in another direction. As such, the sensor may automatically move in one direction with respect to the workpiece without manual intervention, and manually move in another direction, such that the sensor is moved by the combination of automated and manual movement. In addition, the actuating member may have at least two substantially parallel arms extending from near the sensor, which permits the sensor to slide along the workpiece while maintaining a substantially normal relationship to a surface of the workpiece.
摘要:
An eddy current probe and associated method of inspecting a structure are provided that are capable of generating a two-dimensional image of the structure, generally in real time. The eddy current probe includes an eddy current probe array having a plurality of first and second coils that cross one another to define a plurality of sensing elements. The eddy current probe array may also include a plurality of magnetically permeable core elements located coincident with respective sensing elements and at least partially encircled by respective first and second coils. The eddy current probe may also include an alternating current source electrically connected to the first coils and sense electronics for sensing current induced in the second coils. In operation, the current sensed in the second coils represents at least one characteristic of the structure, such as the electrical conductivity of the structure.
摘要:
A method and apparatus for detecting and inspecting composite structures to discover inconsistencies by the force and displacement caused by extension of a stylus driven against the composite structure a fixed distance. The measurement of the force on the stylus and the deflection is made from the exterior surface of the composite structure, which eliminates the need to remove interior panels for inspection.
摘要:
A system and method for inspecting a structure having a coating on at least one surface are provided. The system includes at least one ultrasonic sensor positioned proximate to the structure. Each sensor is capable of transmitting a shear wave toward the structure and receiving return signals in response thereto, wherein the shear wave includes at least one reference beam and at least one interrogating beam. The system further includes a data acquisition system in communication with the sensor for generating information indicative of the coating based on at least one return signal associated with the reference beam.
摘要:
A method and apparatus for detecting and inspecting composite structures to discover inconsistencies by the force and displacement caused by extension of a stylus driven against the composite structure a fixed distance. The measurement of the force on the stylus and the deflection is made from the exterior surface of the composite structure, which eliminates the need to remove interior panels for inspection.
摘要:
Apparatus and methods of measuring the electrical resistance of electrically-conductive materials are disclosed. In one aspect, an apparatus includes a substrate, and first, second, third, and fourth elongated conductive members. Each conductive member includes a first portion at least partially disposed on the substrate and a second portion. Each of the first portions is spaced apart from one or more adjacent first portions and is engageable with the electrically-conductive material along a contact length. The apparatus may include a source operatively coupled to the second portions of the first and fourth conductive members, and a meter operatively coupled to the second portions of second and third conductive members.