WAFER PROCESSING METHOD
    1.
    发明公开

    公开(公告)号:US20240290613A1

    公开(公告)日:2024-08-29

    申请号:US18436272

    申请日:2024-02-08

    Inventor: Naoki KITA

    CPC classification number: H01L21/02354

    Abstract: A wafer processing method includes a circular recess forming step of forming a circular recess in a center of a back surface of a wafer to thereby form an annular projection surrounding the circular recess, and a modified layer forming step of applying a laser beam of such a wavelength as to be transmitted through the wafer to the annular projection to thereby form a modified layer.

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