System and method to efficiently identify bad components in a multi-node system utilizing multiple node topologies
    1.
    发明授权
    System and method to efficiently identify bad components in a multi-node system utilizing multiple node topologies 失效
    使用多节点拓扑来有效地识别多节点系统中的不良组件的系统和方法

    公开(公告)号:US08495425B2

    公开(公告)日:2013-07-23

    申请号:US13037891

    申请日:2011-03-01

    IPC分类号: G06F11/30

    CPC分类号: G06F11/0709 G06F11/0751

    摘要: The exemplary embodiments of the present invention provide a method for efficiently identifying the bad component(s) in a multi-node system. The method includes assigning a unique ID to each of a plurality of nodes on the multi-node system, generating test statistics from a test on a plurality of nodes, and comparing the test statistics for the plurality of nodes against a first topology to generate a first number of clusters of bad nodes. The method further includes comparing the test statistics for the plurality of nodes against a second topology to generate a second number of clusters of bad nodes, and identifying the bad nodes by comparing the cluster sizes to a topology threshold.

    摘要翻译: 本发明的示例性实施例提供了一种用于有效地识别多节点系统中的坏组件的方法。 该方法包括为多节点系统上的多个节点中的每一个分配唯一的ID,从多个节点上的测试生成测试统计信息,以及将多个节点的测试统计与第一拓扑结果进行比较,以生成 第一个坏节点的群集数。 该方法还包括将多个节点的测试统计与第二拓扑进行比较,以生成第二数量的坏节点群集,以及通过将群集大小与拓扑阈值进行比较来识别坏节点。

    SYSTEM AND METHOD TO EFFICIENTLY IDENTIFY BAD COMPONENTS IN A MULTI-NODE SYSTEM UTILIZING MULTIPLE NODE TOPOLOGIES
    2.
    发明申请
    SYSTEM AND METHOD TO EFFICIENTLY IDENTIFY BAD COMPONENTS IN A MULTI-NODE SYSTEM UTILIZING MULTIPLE NODE TOPOLOGIES 失效
    使用多个节点拓扑的多节点系统中有效识别组件的系统和方法

    公开(公告)号:US20120226943A1

    公开(公告)日:2012-09-06

    申请号:US13037891

    申请日:2011-03-01

    IPC分类号: G06F11/00

    CPC分类号: G06F11/0709 G06F11/0751

    摘要: The exemplary embodiments of the present invention provide a method for efficiently identifying the bad component(s) in a multi-node system. The method includes assigning a unique ID to each of a plurality of nodes on the multi-node system, generating test statistics from a test on a plurality of nodes, and comparing the test statistics for the plurality of nodes against a first topology to generate a first number of clusters of bad nodes. The method further includes comparing the test statistics for the plurality of nodes against a second topology to generate a second number of clusters of bad nodes, and identifying the bad nodes by comparing the cluster sizes to a topology threshold.

    摘要翻译: 本发明的示例性实施例提供了一种用于有效地识别多节点系统中的坏组件的方法。 该方法包括为多节点系统上的多个节点中的每一个分配唯一的ID,从多个节点上的测试生成测试统计信息,以及将多个节点的测试统计与第一拓扑结果进行比较,以生成 第一个坏节点的群集数。 该方法还包括将多个节点的测试统计与第二拓扑进行比较,以生成第二数量的坏节点群集,以及通过将群集大小与拓扑阈值进行比较来识别坏节点。