公开(公告)号：US20250138865A1

公开(公告)日：2025-05-01

申请号：US18384931

申请日：2023-10-30

Applicant: Dell Products L.P.

Inventor： Abhishek Mishra ,  Apoorva Neyyanira Ravi ,  Kumar Saurav

IPC: G06F9/46

Abstract: Methods, system, and non-transitory processor-readable storage medium for a component development migration system are provided herein. An example method includes a reverse proxy server that receives a Hypertext Transfer Protocol (HTTP) request from a client system. The reverse proxy server intercepts the HTTP request between the client system and a server. A listener module receives a digital footprint of the HTTP request, where the digital footprint identifies a feature associated with an enterprise application. The method determines a feature score associated with the feature, and an overall feature score using a weighted feature score and a weighted feature priority score. The method then migrates development of a component of the enterprise application to a second enterprise application according to the overall feature score.

公开(公告)号：US20250045189A1

公开(公告)日：2025-02-06

申请号：US18229247

申请日：2023-08-02

Applicant: Dell Products L.P.

Inventor： Abhishek Mishra ,  Vivek Bhargava ,  Kumar Saurav

IPC: G06F11/36 ,  G06N20/00

Abstract: Methods, apparatus, and processor-readable storage media for generating test cases for software testing using machine learning techniques are provided herein. An example computer-implemented method includes obtaining user input data associated with at least one software application; identifying one or more predetermined types of information, including one or more of topic-related information and entity-related information, from at least a portion of the user input data using at least a first set of one or more machine learning techniques; generating one or more test cases for testing at least a portion of the at least one software application by processing at least a portion of the identified information using at least a second set of one or more machine learning techniques; and performing one or more automated actions based at least in part on at least one of the one or more generated test cases.

公开(公告)号：US20250004936A1

公开(公告)日：2025-01-02

申请号：US18342882

申请日：2023-06-28

Applicant: Dell Products L.P.

Inventor： Abhishek Mishra ,  Vivek Bhargava ,  Sharada Desai ,  Kumar Saurav

IPC: G06F11/36

Abstract: An apparatus comprises a processing device configured to determine specifications for an information technology asset to be developed, and to identify, utilizing at least one machine learning model, whether at least one of the specifications for the information technology asset is defect-prone, wherein a given specification is identified as defect-prone responsive to at least one output of the at least one machine learning model indicating that the given specification has at least a threshold likelihood of resulting in one or more defects during development of the information technology asset. The processing device is also configured to establish a mapping between the one or more identified defect-prone specifications for the information technology asset and one or more components of the information technology asset, and to modify one or more development processes for the information technology asset based at least in part on the established mapping.