Zero connection for on-chip testing

    公开(公告)号:US06605952B2

    公开(公告)日:2003-08-12

    申请号:US09891463

    申请日:2001-06-27

    IPC分类号: G01R3102

    CPC分类号: G01R1/07314

    摘要: In order to make a connection to a test bus on a printed circuit board within a system or platform for the purpose of testing circuits within the system, a regular pattern of contact points which are coupled to the circuits to be tested are formed on the printed circuit board. The contact points are contacted with a plurality of spring loaded contacts, supported in a pattern which is the same as the pattern of contact points, with the spring loaded contacts being coupled to test equipment for testing the circuits.