公开(公告)号：US07136056B2

公开(公告)日：2006-11-14

申请号：US10331781

申请日：2002-12-31

申请人： Don Gyou Lee ,  Il Ho Kim

发明人： Don Gyou Lee ,  Il Ho Kim

IPC分类号： G09G5/00

CPC分类号： G09G3/006 ,  G09G3/36 ,  H04N17/04

摘要： An image quality analysis method and an image quality analysis system for a display device are provided. The image quality analysis method and image quality analysis system provides a quantitative determination of image quality for display devices, thereby providing an objective and fair evaluation criterion.

公开(公告)号：US08045129B2

公开(公告)日：2011-10-25

申请号：US12314702

申请日：2008-12-15

申请人： Hee Kwang Kang ,  Jun Hyeok Yu ,  Mi Young Do ,  Il Ho Kim

发明人： Hee Kwang Kang ,  Jun Hyeok Yu ,  Mi Young Do ,  Il Ho Kim

IPC分类号： C09K19/02

CPC分类号： G02F1/13338

摘要： A display device includes a plurality of gate lines and a plurality of data lines crossing each other on a first substrate, to define a pixel; a first thin film transistor in a portion where the gate lines and the data lines cross each other; a plurality of position detection lines on the first substrate, the position detection lines spaced a constant distance from the data lines and crossing the gate lines; a second thin film transistor for detecting a position, in a portion on the first substrate where the gate lines and the position detection lines cross each other; a protrusion pattern protruding from a second substrate and corresponding to a drain electrode of the second thin film transistor; and a transparent conductive layer on the protrusion pattern, electrically connected to the drain electrode when touching.

摘要翻译： 显示装置包括在第一基板上彼此交叉的多条栅极线和多条数据线，以限定像素; 栅极线和数据线交叉的部分中的第一薄膜晶体管; 多个位置检测线，位于所述第一基板上，所述位置检测线与所述数据线间隔一定距离并与所述栅极线交叉; 第二薄膜晶体管，用于在第一基板上的栅极线和位置检测线彼此交叉的部分中检测位置; 从第二基板突出并对应于第二薄膜晶体管的漏电极的突起图案; 以及在突起图案上的透明导电层，当触摸时电连接到漏电极。