公开(公告)号：US20240233261A1

公开(公告)日：2024-07-11

申请号：US18319553

申请日：2023-05-18

Applicant: ECOPIA TECH CORPORATION

Inventor： Yuanming SHU ,  Shuo TAN ,  Zihao CHEN ,  Ruijie DENG

IPC: G06T17/05 ,  G06T7/60 ,  G06T17/10 ,  G06V20/10

CPC classification number: G06T17/05 ,  G06T7/60 ,  G06T17/10 ,  G06V20/176 ,  G06T2210/04 ,  G06V2201/12

Abstract: Methods and systems for determining the height of structures based on imagery of the structures and associated two-dimensional vector data are provided. An example method involves projecting two-dimensional vector data outlining a roof of a structure into images of the structure captured from different perspectives and feature matching the vector data across the imagery to determine a best-matching three-dimensional position for the roof situated at the height of the structure.