公开(公告)号：US20200316608A1

公开(公告)日：2020-10-08

申请号：US16758334

申请日：2018-11-26

Applicant: ENPLAS CORPORATION

Inventor： Nobuhiro KOJIMA ,  Yasuhiro WATANABE ,  Koji MURAKI ,  Tomoki NAKAO

IPC: B01L9/00 ,  B01L3/00

Abstract: A placement holder 1 for an analysis according to the present invention includes a frame portion 10 for placing an analysis plate, and a coupling portion 11; wherein the analysis plate includes, respectively at opposite ends in a longitudinal direction thereof, protrusions protruding in the longitudinal direction; the frame portion 10 includes a pair of wall portions that are opposed to each other, and a space surrounded by the frame portion 10 has an area 12 in which the analysis plate is to be placed; the pair of wall portions have a pair of cavities 13 into which the protrusions of the analysis plate are to be inserted, and at least one of the pair of cavities 13 is a through hole; the wall portion having the through hole has, on an inner surface thereof, an inclined surface 14 formed such that an interval between inner surfaces of the pair of wall portions gradually decreases from an upper end side toward the through hole of the wall portion; and the coupling portion 11 is disposed below the pair of cavities 13 so as to couple one of the wall portions to the other wall portion.