LOCATION DETERMINATION METHOD AND LOCATION DETERMINATION SYSTEM FOR SENSOR APPARATUS PLACEMENTS IN BUILDING
    1.
    发明申请
    LOCATION DETERMINATION METHOD AND LOCATION DETERMINATION SYSTEM FOR SENSOR APPARATUS PLACEMENTS IN BUILDING 审中-公开
    传感器装置位置确定方法及位置确定系统

    公开(公告)号:US20160262032A1

    公开(公告)日:2016-09-08

    申请号:US14655369

    申请日:2014-12-15

    Inventor: Jeong-Ho KIM

    Abstract: A location determining method 200 for sensor apparatus placements in building includes: a step in which a first measuring device transmits a digitally modulated first test packet through a specific channel at a first location in a building (210); a step in which a second measuring device receives the first test packet and transmits a first echo back signal through the specific channel at a second location in the building (220); a step in which the first measuring device receives the first echo back signal transmitted from the second measuring device and measures a first channel quality of the specific channel based on the first echo back signal (230); a step in which the first measuring device transmits a digitally modulated second test packet through the specific channel (240); a step in which the second measuring device receives the second test packet and transmits a second echo back signal through the specific channel (250); and a step in which the first measuring device receives the second echo back signal transmitted from the second measuring device and measures a second channel quality of the specific channel based on the second echo back signal (260).

    Abstract translation: 用于建筑物中的传感器设备布置的位置确定方法200包括:第一测量设备在建筑物(210)的第一位置通过特定通道发送数字调制的第一测试分组的步骤; 第二测量装置在建筑物(220)的第二位置处接收第一测试分组并通过特定频道发送第一回波信号的步骤; 第一测量装置接收从第二测量装置发送的第一回波信号并基于第一回波信号测量特定信道的第一信道质量的步骤; 第一测量装置通过特定频道(240)发送经数字调制的第二测试分组的步骤; 第二测量装置接收第二测试分组并通过特定频道发送第二回波信号的步骤(250); 以及第一测量装置接收从第二测量装置发送的第二回波信号并基于第二回波信号测量特定信道的第二信道质量的步骤。

Patent Agency Ranking