公开(公告)号：US09106334B2

公开(公告)日：2015-08-11

申请号：US14273652

申请日：2014-05-09

Applicant: EXFO Inc.

Inventor： Mathias Westlund ,  Henrik Sunnerud

IPC: H04B10/073 ,  H04B10/61

CPC classification number: H04B10/0731 ,  H04B10/614

Abstract: There are provided a method and a system for characterizing the CMRR of an ICR under test, which employ highly coherent light from two continuous-wave (CW) single-frequency lasers whose respective optical frequencies mutually differ by an offset defining an “Intermediate Frequency” (fIF) in the rf electrical baseband. The method involves the coherent mixing of light from these two lasers in the ICR under test. A “tone” in the rf electrical baseband at frequency fIF is generated by the beating of light from the two single-frequency lasers as they interfere on the photodetectors of the ICR. The resulting tone at frequency fIF in the output electrical signals of the ICR is then detected and analyzed to characterize the CMRR of the ICR.

Abstract translation: 提供了一种用于表征正在测试的ICR的CMRR的方法和系统，其使用来自两个连续波（CW）单频激光器的高度相干的光，其相应的光频率相互限定“中间频率” （fIF）在rf电基带。 该方法涉及在被测试的ICR中来自这两个激光器的光的相干混合。 频率为fIF的RF电基带中的“音调”通过来自两个单频激光器的光的抖动产生，因为它们干扰ICR的光电检测器。 然后检测和分析ICR的输出电信号中频率fIF产生的音调，以表征ICR的CMRR。

公开(公告)号：US09673899B2

公开(公告)日：2017-06-06

申请号：US14223165

申请日：2014-03-24

Applicant: EXFO INC.

Inventor： Henrik Sunnerud ,  Mats Skold ,  Mathias Westlund

IPC: H04J14/06 ,  H04B10/079

CPC classification number: H04B10/07953 ,  H04J14/06

Abstract: There is provided a system and a method for determining an in-band noise parameter representative of the optical noise contribution (such as OSNR) on a polarization-multiplexed optical Signal-Under-Test (SUT) comprising two polarized phase-modulated data-carrying contributions and an optical noise contribution. For each of a multiplicity of distinct polarization-analyzer conditions, the SUT is analyzed to provide at least one polarization-analyzed component of the SUT and the polarization-analyzed component is detected with an electronic bandwidth at least ten times smaller than the symbol rate of the SUT to obtain a corresponding acquired electrical signal; for each acquired electrical signal, a value of a statistical parameter is determined from the ac component of the acquired electrical signal, thereby providing a set of statistical-parameter values corresponding to the multiplicity of distinct polarization-analyzer conditions; and, from the set of statistical-parameter values, the in-band noise parameter is mathematically determined.

公开(公告)号：US20150110486A1

公开(公告)日：2015-04-23

申请号：US14223165

申请日：2014-03-24

Applicant: EXFO INC.

Inventor： Henrik Sunnerud ,  Mats Skold ,  Mathias Westlund

IPC: H04B10/079 ,  H04J14/06

CPC classification number: H04B10/07953 ,  H04J14/06

Abstract: There is provided a system and a method for determining an in-band noise parameter representative of the optical noise contribution (such as OSNR) on a polarization-multiplexed optical Signal-Under-Test (SUT) comprising two polarized phase-modulated data-carrying contributions and an optical noise contribution. For each of a multiplicity of distinct polarization-analyzer conditions, the SUT is analyzed to provide at least one polarization-analyzed component of the SUT and the polarization-analyzed component is detected with an electronic bandwidth at least ten times smaller than the symbol rate of the SUT to obtain a corresponding acquired electrical signal; for each acquired electrical signal, a value of a statistical parameter is determined from the ac component of the acquired electrical signal, thereby providing a set of statistical-parameter values corresponding to the multiplicity of distinct polarization-analyzer conditions; and, from the set of statistical-parameter values, the in-band noise parameter is mathematically determined.

Abstract translation: 提供了一种系统和方法，用于在偏振复用光信号不足测试（SUT）上确定表示光噪声贡献（例如OSNR）的带内噪声参数的系统和方法，该信号包括两个偏振相位调制数据携带 贡献和光学噪声贡献。 对于多个不同的偏振分析器条件中的每一个，分析SUT以提供至少一个SUT的偏振分析分量，并且以电子带宽检测偏振分析的分量，比电子带宽小至少比符号率 SUT获得相应的获取的电信号; 对于每个获取的电信号，从所获取的电信号的ac分量确定统计参数的值，从而提供与多个不同偏振分析器条件对应的一组统计参数值; 并且从该组统计参数值中，数学地确定带内噪声参数。