公开(公告)号：US20060013360A1

公开(公告)日：2006-01-19

申请号：US11232574

申请日：2005-09-22

申请人： Edward Sommer ,  Robert Parrish ,  David Spencer ,  Charles Roos

发明人： Edward Sommer ,  Robert Parrish ,  David Spencer ,  Charles Roos

IPC分类号： G01N23/223 ,  G01T1/36

CPC分类号： B07C5/3427 ,  B07C5/346 ,  B07C5/365 ,  G01N23/223 ,  G01N2223/076

摘要： A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection. The x-ray source may irradiate the first x-rays at a high intensity, and the x-ray source may be an x-ray tube.

摘要翻译： 一种系统和过程，用于在系统连接到电源的高速下对未知组成的材料进行分类。 用X射线源的第一x射线照射该片，使该片发出X射线。 用x射线检测器检测荧光的X射线，并将该片材从检测到的荧光X射线分类。 检测和分类可能在不到一秒内累积执行。 可以从检测到的荧光X射线确定该片材料的X射线荧光光谱，并且可以调节荧光X射线的检测，使得x射线荧光光谱的精确测定不会受到严重影响， 由外来X射线减慢或复杂。 可以通过识别确定的X射线荧光光谱的光谱图来分类该材料。 在照射和检测之前，该片材料可以变平。 x射线源可以以高强度照射第一x射线，并且x射线源可以是X射线管。

公开(公告)号：US20060239401A1

公开(公告)日：2006-10-26

申请号：US11357432

申请日：2006-02-17

申请人： Edward Sommer ,  Robert Parrish ,  David Spencer ,  Charles Roos

发明人： Edward Sommer ,  Robert Parrish ,  David Spencer ,  Charles Roos

IPC分类号： G01N23/223 ,  G01T1/36

CPC分类号： B07C5/3427 ,  B07C5/346 ,  B07C5/365 ,  G01N23/223 ,  G01N2223/076

摘要： A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection. The x-ray source may irradiate the first x-rays at a high intensity, and the x-ray source may be an x-ray tube.

公开(公告)号：US20050078786A1

公开(公告)日：2005-04-14

申请号：US10967981

申请日：2004-10-19

申请人： Edward Sommer ,  Robert Parrish ,  David Spencer ,  Charles Roos

发明人： Edward Sommer ,  Robert Parrish ,  David Spencer ,  Charles Roos

IPC分类号： B07C5/342 ,  B07C5/346 ,  G01N23/223 ,  G01T1/36

CPC分类号： B07C5/3427 ,  B07C5/346 ,  B07C5/365 ,  G01N23/223 ,  G01N2223/076

摘要： A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection. The x-ray source may irradiate the first x-rays at a high intensity, and the x-ray source may be an x-ray tube.

摘要翻译： 一种系统和过程，用于在系统连接到电源的高速下对未知组成的材料进行分类。 用X射线源的第一x射线照射该片，使该片发出X射线。 用x射线检测器检测荧光的X射线，并将该片材从检测到的荧光X射线分类。 检测和分类可能在不到一秒内累积执行。 可以从检测到的荧光X射线确定该片材料的X射线荧光光谱，并且可以调节荧光X射线的检测，使得x射线荧光光谱的精确测定不会受到严重影响， 由外来X射线减慢或复杂。 可以通过识别确定的X射线荧光光谱的光谱图来分类该材料。 在照射和检测之前，该片材料可以变平。 x射线源可以以高强度照射第一x射线，并且x射线源可以是X射线管。