公开(公告)号：US11788834B2

公开(公告)日：2023-10-17

申请号：US17284470

申请日：2018-10-12

申请人： Electric Power Research Institute, Inc.

发明人： David Stoutamire ,  Dennis Hussey

IPC分类号： G01B11/25 ,  G06T7/521

CPC分类号： G01B11/2527 ,  G06T7/521 ,  G06T2207/30108

摘要： Provided is a method for measuring surface characteristics of at least a portion of an object, including providing a light source; generating a first interference pattern on the at least a portion of the object; capturing an image of the first interference pattern; shifting the phase of the light source to generate a second interference pattern; capturing an image of the second interference pattern; filtering distortion from the interference patterns; extracting a wrapped phase of the at least a portion of the object based on the images; unwrapping the wrapped phase of the at least a portion of the object to generate an unwrapped phase; identifying a computed depth map distance to the at least a portion of the object; and fitting an ideal part to the computed depth map of the at least a portion of the object to measure the surface characteristics.