公开(公告)号：US20160266051A1

公开(公告)日：2016-09-15

申请号：US14934824

申请日：2015-11-06

Applicant: Electronics and Telecommunications Research Institute

Inventor： Kwang Jae LEE ,  Jang Yeol KIM ,  Laxmikant MINZ ,  Seong Ho SON ,  Simonov NIKOLAI ,  Soon Ik JEON

IPC: G01N22/00

CPC classification number: G01N22/00 ,  A61B5/0507 ,  A61B5/4312 ,  A61B2560/0223 ,  G01S7/40 ,  G01S13/89

Abstract: Provided is an apparatus and method for calibrating acquired scattering data in a three-dimensional (3D) microwave imaging system. A scattering data calibrating method may include acquiring microwave scattering data for each height of a tank containing a target using a microwave transceiving sensor; and calibrating the microwave scattering data based on a variation between a plurality of sets of microwave scattering data. A height of the tank at which the microwave scattering data is to be acquired may be determined based on a height of the microwave transceiving sensor is located in the tank.

Abstract translation: 提供了一种用于在三维（3D）微波成像系统中校准所获取的散射数据的装置和方法。 散射数据校准方法可以包括使用微波收发传感器获取包含目标的罐的每个高度的微波散射数据; 并且基于多组微波散射数据之间的变化来校准微波散射数据。 要获取微波散射数据的容器的高度可以基于微波收发传感器位于罐中的高度来确定。