公开(公告)号：US20240176325A1

公开(公告)日：2024-05-30

申请号：US18209918

申请日：2023-06-14

Applicant: Electronics and Telecommunications Research Institute

Inventor： Nack Woo Kim ,  Byung-Tak Lee ,  JUNGI LEE ,  Hyun Yong Lee ,  Yumin HWANG

IPC: G05B19/4065

CPC classification number: G05B19/4065 ,  G05B2219/50185

Abstract: The present invention relates to a system and method for predicting AI useful life based on accelerated life testing data. The system for predicting AI useful life based on accelerated life testing data according to the present invention includes a feature extraction unit configured to receive accelerated life training data and actual operation testing result and encodes the received accelerated life training data and actual operation testing result into a latent variable, a regression network configured to be branched for each domain of data received by the feature extraction unit, and a domain discrimination network configured to map the accelerated life training data and actual operation testing result to the latent variables in a latent space.