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公开(公告)号：US20170322098A1
公开(公告)日：2017-11-09
申请号：US15144985
申请日：2016-05-03
Applicant: FREESCALE SEMICONDUCTOR, INC.
Inventor： Chad Dawson , Keith Kraver , Shiraz Contractor
CPC classification number: G01L9/0072 , G01L27/007
Abstract: A pressure sensor device and a method for testing the pressure sensor device is provided. The pressure sensor device includes a first pressure sensor cell having a first capacitance value, and a second pressure sensor cell having a second capacitance value, the second capacitance value being different from the first capacitance value. In one embodiment, the method includes determining a temperature coefficient offset to test for faults in the pressure sensor device. In another embodiment, the method includes determining a differential mode calculation and a common mode calculation. A fault exists if the differential and common mode calculations do not agree.
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公开(公告)号：US10436659B2
公开(公告)日：2019-10-08
申请号：US15144985
申请日：2016-05-03
Applicant: FREESCALE SEMICONDUCTOR, INC.
Inventor： Chad Dawson , Keith Kraver , Shiraz Contractor
Abstract: A pressure sensor device and a method for testing the pressure sensor device is provided. The pressure sensor device includes a first pressure sensor cell having a first capacitance value, and a second pressure sensor cell having a second capacitance value, the second capacitance value being different from the first capacitance value. In one embodiment, the method includes determining a temperature coefficient offset to test for faults in the pressure sensor device. In another embodiment, the method includes determining a differential mode calculation and a common mode calculation. A fault exists if the differential and common mode calculations do not agree.
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