公开(公告)号：US20230083964A1

公开(公告)日：2023-03-16

申请号：US18051281

申请日：2022-10-31

Applicant: FUJIFILM Corporation

Inventor： Kenji SASAHARA ,  Shota UEKI ,  Hiroyuki NIWA ,  Makoto OMOTO

IPC: G01S17/89 ,  G06T7/521

Abstract: Provided are a surface pressure analysis device, a surface pressure analysis method, and a surface pressure analysis program capable of automatically evaluating the surface pressure applied to an inspection surface of a measurement object and supporting an inspector who performs a pass/fail determination of the measurement object. An image acquisition unit (210A) of a server that functions as the surface pressure analysis device acquires an inspection image (10) from a user terminal. The inspection image (10) is a capture image of a pressure measurement sheet that is disposed on the inspection surface of the measurement object and color-developed with a density distribution according to the intensity of the pressure applied to the inspection surface. A conversion unit (222) converts the density value of the inspection image (10) into a two-dimensionally distributed first pressure value. An evaluation information generation processing unit (224) compares the first pressure value with a limit sample read from a memory (240), and generates information (evaluation information) indicating the rate of match between the two as a primary determination result. The primary determination result is output (transmitted) from the output unit (210B) to the user terminal and displayed on a display of the user terminal.