公开(公告)号：US07675299B2

公开(公告)日：2010-03-09

申请号：US12396659

申请日：2009-03-03

Applicant: Frederick J. Lane

Inventor： Frederick J. Lane

IPC: G01R27/14 ,  G01R27/08

CPC classification number: G01R27/205 ,  G01R1/067

Abstract: According to some embodiments, a method of determining a resistance of probes on a contactor device is disclosed. The contactor device can include a plurality of probes disposed to contact an electronic device to be tested. The method can include electrically connecting a pair of the probes to each other, and then forcing one of a voltage onto or a current through the pair of the probes. At a location on the contactor device, the other of a voltage across or a current through the pair of the probes can be sensed. A determination relating to a resistance of the probes can be determined from the values of the forced voltage or current and sensed other of the voltage or current.

Abstract translation: 根据一些实施例，公开了一种确定接触器装置上探头的电阻的方法。 接触器装置可以包括多个探针，其设置成接触要测试的电子设备。 该方法可以包括将一对探针彼此电连接，然后将电压中的一个强制施加到一对探针上或通过一对探针。 在接触器装置上的位置处，可以感测通过该对探针的电压或电流中的另一个。 可以根据强制电压或电流的值和感测到的其他电压或电流来确定与探针的电阻有关的确定。

公开(公告)号：US20090160464A1

公开(公告)日：2009-06-25

申请号：US12396659

申请日：2009-03-03

Applicant: Frederick J. Lane

Inventor： Frederick J. Lane

IPC: G01R27/08

CPC classification number: G01R27/205 ,  G01R1/067

Abstract: According to some embodiments, a method of determining a resistance of probes on a contactor device is disclosed. The contactor device can include a plurality of probes disposed to contact an electronic device to be tested. The method can include electrically connecting a pair of the probes to each other, and then forcing one of a voltage onto or a current through the pair of the probes. At a location on the contactor device, the other of a voltage across or a current through the pair of the probes can be sensed. A determination relating to a resistance of the probes can be determined from the values of the forced voltage or current and sensed other of the voltage or current.

Abstract translation: 根据一些实施例，公开了一种确定接触器装置上探头的电阻的方法。 接触器装置可以包括多个探针，其设置成接触要测试的电子设备。 该方法可以包括将一对探针彼此电连接，然后将电压中的一个强制施加到一对探针上或通过一对探针。 在接触器装置上的位置处，可以感测通过该对探针的电压或电流中的另一个。 可以根据强制电压或电流的值和感测到的其他电压或电流来确定与探针的电阻有关的确定。

公开(公告)号：US07498824B2

公开(公告)日：2009-03-03

申请号：US11466145

申请日：2006-08-22

Applicant: Frederick J. Lane

Inventor： Frederick J. Lane

IPC: G01R27/08

CPC classification number: G01R27/205 ,  G01R1/067

Abstract: According to some embodiments, a method of determining a resistance of probes on a contactor device is disclosed. The contactor device can include a plurality of probes disposed to contact an electronic device to be tested. The method can include electrically connecting a pair of the probes to each other, and then forcing one of a voltage onto or a current through the pair of the probes. At a location on the contactor device, the other of a voltage across or a current through the pair of the probes can be sensed. A determination relating to a resistance of the probes can be determined from the values of the forced voltage or current and sensed other of the voltage or current.

Abstract translation: 根据一些实施例，公开了一种确定接触器装置上探头的电阻的方法。 接触器装置可以包括多个探针，其设置成接触要测试的电子设备。 该方法可以包括将一对探针彼此电连接，然后将电压中的一个强制施加到一对探针上或通过一对探针。 在接触器装置上的位置处，可以感测通过该对探针的电压或电流中的另一个。 可以根据强制电压或电流的值和感测到的其他电压或电流来确定与探针的电阻有关的确定。

公开(公告)号：US20080061803A1

公开(公告)日：2008-03-13

申请号：US11466145

申请日：2006-08-22

Applicant: Frederick J. Lane

Inventor： Frederick J. Lane

IPC: G01R27/08

CPC classification number: G01R27/205 ,  G01R1/067

Abstract: According to some embodiments, a method of determining a resistance of probes on a contactor device is disclosed. The contactor device can include a plurality of probes disposed to contact an electronic device to be tested. The method can include electrically connecting a pair of the probes to each other, and then forcing one of a voltage onto or a current through the pair of the probes. At a location on the contactor device, the other of a voltage across or a current through the pair of the probes can be sensed. A determination relating to a resistance of the probes can be determined from the values of the forced voltage or current and sensed other of the voltage or current.

Abstract translation: 根据一些实施例，公开了一种确定接触器装置上探头的电阻的方法。 接触器装置可以包括多个探针，其设置成接触要测试的电子设备。 该方法可以包括将一对探针彼此电连接，然后将电压中的一个强制施加到一对探针上或通过一对探针。 在接触器装置上的位置处，可以感测通过该对探针的电压或电流中的另一个。 可以根据强制电压或电流的值和感测到的其他电压或电流来确定与探针的电阻有关的确定。