公开(公告)号：US20230408416A1

公开(公告)日：2023-12-21

申请号：US18140891

申请日：2023-04-28

Applicant: GENENTECH, INC.

Inventor： Aron Lee ,  Rashmi Sharma ,  Justin Joo-Ho Jeong ,  Michael Tae-Jon Kim

IPC: G01N21/77

CPC classification number: G01N21/77 ,  G01N2021/7786

Abstract: The present disclosure relates to methods and kits for detecting a free thiol in a substrate as well as methods for quantifying the amount of free thiol in a substrate. In particular, the present disclosure provides a fluorescent Ellman assay for enhanced sensitivity of free thiol detection and quantification.