Apparatus and method for vector s-parameter measurements

    公开(公告)号:US09910124B2

    公开(公告)日:2018-03-06

    申请号:US15015176

    申请日:2016-02-04

    CPC classification number: G01R35/005 G01R27/02 G01R27/28

    Abstract: The disclosure relates to an apparatus and a method for vector scattering parameter (s-parameter) measurements, and more particularly, to an apparatus and a method for providing a simple, low cost solution for tests requiring vector s-parameter measurements. The apparatus includes a source which provides an input signal, a divider which splits the input signal to a reference signal and a testing signal, a phase shifter which shifts the reference signal by a first phase and outputs a phase shifted signal, a device under test (DUT) which shifts the testing signal by a second phase and outputs a DUT shifted signal, a combiner which combines the phase shifted signal and the DUT shifted signal into a combined signal, and a detector which detects a product of the phase shifted signal and the DUT shifted signal.

    Apparatus and method for vector s-parameter measurements

    公开(公告)号:US10379191B2

    公开(公告)日:2019-08-13

    申请号:US15868248

    申请日:2018-01-11

    Abstract: The disclosure relates to an apparatus and a method for vector scattering parameter (s-parameter) measurements, and more particularly, to an apparatus and a method for providing a simple, low cost solution for tests requiring vector s-parameter measurements. The apparatus includes a source which provides an input signal, a divider which splits the input signal to a reference signal and a testing signal, a phase shifter which shifts the reference signal by a first phase and outputs a phase shifted signal, a device under test (DUT) which shifts the testing signal by a second phase and outputs a DUT shifted signal, a combiner which combines the phase shifted signal and the DUT shifted signal into a combined signal, and a detector which detects a product of the phase shifted signal and the DUT shifted signal.

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