公开(公告)号：US20240395498A1

公开(公告)日：2024-11-28

申请号：US18323669

申请日：2023-05-25

Applicant: GM Global Technology Operations LLC

Inventor： Chelsea Edge ,  Melissa Rose Galant ,  Wei Wu

IPC: H01J37/28 ,  H01J37/20

Abstract: An orientation tool for orienting a sample mount having a sample for evaluation by a scanning electron microscope using an electron backscatter diffraction detector includes a body having a bottom surface and a top surface, an angled flat face extending from the bottom surface to the top surface, and a mount portion formed in the body between the top surface and the angled flat face. The mount portion is defined by a wall and a support surface. The wall extends from the top surface to the support surface and the support surface extends from the wall to the angled flat face. The wall is angled at 20 degrees with respect to an imaginary vertical line perpendicular to the bottom surface. The mount portion is sized to receive the sample mount and orient the sample relative to the electron backscatter diffraction detector.