-
公开(公告)号：US20230039805A1
公开(公告)日：2023-02-09
申请号：US17758788
申请日：2020-11-18
Applicant: GOERTEK INC.
Inventor： Yangyang YU , Shiyu LI
Abstract: A method and device for testing product quality are disclosed. The method for testing product quality comprises: acquiring an image of a product to be tested; testing the image by using a pre-trained neural network model to obtain a testing result output by the neural network model; when the testing result indicates that the product to be tested is a defective product, performing a secondary judgment on the testing result according to position information of defective feature pixels in the image in the testing result, and determining whether the product to be tested is qualified according to a secondary judgment result. The method has high test accuracy, ensures the quality of product and facilitates reducing the labor cost of test.
-
公开(公告)号：US20220172337A1
公开(公告)日：2022-06-02
申请号：US17594142
申请日：2020-10-30
Applicant: GOERTEK INC.
Inventor： Shiyu LI , Yifan ZHANG , Jifeng TIAN
Abstract: A character defect detection method and device are disclosed. The character defect detection method comprises: acquiring an image to be inspected containing a character and a template character image corresponding to the character, and converting the image to be inspected into an image having a format consistent with a format of the template character image; extracting a first valid area containing the character from the image to be inspected, and extracting a second valid area containing a template character from the template character image; obtaining a first image based on the first valid area, and obtaining a second image based on the second valid area; calculating a transformed image indicating an information difference between the first image and the second image based on the first image and the second image; and obtaining a character defect detection result of the image to be inspected based on information of the transformed image.
-
Search Results
2
records
(took 0.013 seconds)
