公开(公告)号：US20240296537A1

公开(公告)日：2024-09-05

申请号：US18547911

申请日：2021-06-24

Applicant: GOERTEK INC.

Inventor： Zengyuan GAI ,  Xiaoyu CHI

IPC: G06T7/00 ,  G06T7/11

CPC classification number: G06T7/0002 ,  G06T7/11

Abstract: A defect detection method and apparatus and an electronic device are disclosed. The method comprises: acquiring an image of an object to be detected (S1100); acquiring brightness information of pixels in the image (S1200); and acquiring appearance defect information of the object to be detected based on the brightness information (S1300), wherein the appearance defect information represents defects existing in an appearance of the object to be detected. This method enables the electronic device to quickly and accurately obtain the appearance defect information of the object to be detected, thereby saving human labor and improving the user experience.