公开(公告)号：US11580430B2

公开(公告)日：2023-02-14

申请号：US16257367

申请日：2019-01-25

申请人： General Electric Company

发明人： Lembit Salasoo ,  Vipul K. Gupta ,  Xiaohu Ping ,  Subhrajit Roychowdhury ,  Justin Gambone, Jr. ,  Naresh Iyer ,  Xiaolei Shi ,  Mengli Wang

IPC分类号： G06N7/00 ,  G06N20/00 ,  G06F30/00 ,  B22F10/20 ,  B33Y10/00 ,  B33Y50/02 ,  G06F119/18 ,  B22F10/30

摘要： Determining a quality score for a part manufactured by an additive manufacturing machine based on build parameters and sensor data without the need for extensive physical testing of the part. Sensor data is received from the additive manufacturing machine during manufacture of the part using a first set of build parameters. The first set of build parameters is received. A first algorithm is applied to the first set of build parameters and the received sensor data to generate a quality score. The first algorithm is trained by receiving a reference derived from physical measurements performed on at least one reference part built using a reference set of build parameters. The quality score is output via the communication interface of the device.