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1.发明公开公开(公告)号：US20240159711A1
公开(公告)日：2024-05-16
申请号：US17985501
申请日：2022-11-11
CPC分类号： G01N29/043 , G06T7/0004 , G01N2291/044 , G06T2207/30164
摘要： An inspection system and related methods are provided. The inspection system includes an inspection camera, a plurality of light sources collocated with the inspection camera, and a post processing system. The plurality of light sources output directional light that have different respective ranges of light wavelengths. The inspection camera is configured to capture image data while a surface of interest is being illuminated with the directional light. Further, the post processing system is configured to receive the image data, process portions of the image data into a plurality of images that include distinct images corresponding to the different respective ranges of light wavelengths. The plurality of images can be reviewed to identify an abnormal region of the surface of interest.
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公开(公告)号：US20240314447A1
公开(公告)日：2024-09-19
申请号：US18141493
申请日：2023-05-01
发明人： Vamshi Krishna Reddy Kommareddy , Biswajit Medhi , Andrew Crispin Graham , Walter V. Dixon , James Vradenburg Miller
CPC分类号： H04N23/74 , H04N23/6812 , H04N23/6845 , H04N23/73 , H04N23/689
摘要： A pulse illumination imaging system is provided. The system includes an image sensor, a light source, and a controller. The image sensor includes a plurality of light sensitive pixel elements that are activatable for a designated exposure time to capture one or more images. The controller is configured to determine an activation time to activate the image sensor based on motion of a target element relative to the image sensor; activate the image sensor at the activation time; and activate the light source during the exposure time of the image sensor to produce a pulse having a preconfigured time duration that is less than the exposure time of the image sensor.
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公开(公告)号：US20240163537A1
公开(公告)日：2024-05-16
申请号：US17985459
申请日：2022-11-11
发明人： Vamshi Krishna Reddy Kommareddy , Biswajit Medhi , Sandeep Kumar , Byron Andrew Pritchard , Andrew Crispin Graham , Peter John Nisbet
IPC分类号： H04N5/225 , G01N21/954
CPC分类号： H04N5/22525 , G01N21/954 , H04N5/2256 , H04N2005/2255
摘要： An inspection system and related methods that employ directional light for enhanced imaging are provided. The inspection system includes an inspection camera and at least one directional light source positionable in an offset position from a field of view of the inspection camera. The at least one directional light source is configured to emit directional light from the offset position into the field of view of the inspection camera so as to produce shadows on a surface of interest. Further, the inspection system includes a display device coupled to the inspection camera and the inspection camera is configured to capture one or more images of the shadows produced on the surface of interest. The display device is configured to receive and display the one or more images.
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