公开(公告)号：US10718617B2

公开(公告)日：2020-07-21

申请号：US15742761

申请日：2017-09-13

Applicant: Goertek Inc.

Inventor： Jiudong Wang ,  Bo Li ,  Hui Qi

IPC: G01C21/08 ,  G01R33/02 ,  G01C21/20 ,  G01C25/00

Abstract: The present invention discloses a method and an apparatus for measuring a posture angle of an object. The method comprises the following steps: arranging a sensor in a measured object, the sensor being used for measuring characteristic quantities of magnetic field in three dimensional directions; actuating the sensor at the beginning of the measurement, and acquiring, by using the sensor, a current measured value of the characteristic quantity of magnetic field of the measured object in a carrier coordinate system; acquiring reference values of the characteristic quantities of magnetic field of the measured object in a geographic coordinate system; and calculating a current posture angle of the measured object according to numerical values of the characteristic quantities of magnetic field indicated by the reference value and the measured value in each direction respectively.