公开(公告)号：US20220358392A1

公开(公告)日：2022-11-10

申请号：US17623194

申请日：2019-10-25

Applicant: Google LLC

Inventor： Kevin Satzinger ,  Charles Neill ,  Julian Shaw Kelly ,  Andrew Dunsworth

IPC: G06N10/20 ,  G06N10/70

Abstract: Methods, systems and apparatus for benchmarking quantum computing hardware. In one aspect, a method includes defining an initial circuit configured to operate on an array of qubits, wherein the initial circuit comprises multiple instances of the two-qubit gate, wherein each instance of the two-qubit gate performs a same operation on a respective pair of neighboring qubits in the array; partitioning the initial circuit into multiple layers, wherein instances of the two-qubit gate in a respective layer can be implemented in parallel; for each of the multiple layers: constructing benchmarking circuits for the layer, wherein each benchmarking circuit for the layer comprises one or more cycles of quantum gates, each cycle comprising: the layer of instances of the two-qubit gate, and a plurality of single qubit gates; implementing the constructed benchmarking circuits to obtain experimental benchmarking data; and adjusting control parameters of the control model using the experimental benchmarking data.

公开(公告)号：US12204993B2

公开(公告)日：2025-01-21

申请号：US17623194

申请日：2019-10-25

Applicant: Google LLC

Inventor： Kevin Satzinger ,  Charles Neill ,  Julian Shaw Kelly ,  Andrew Dunsworth

IPC: G06N10/20 ,  G06N10/70

Abstract: Methods, systems and apparatus for benchmarking quantum computing hardware. In one aspect, a method includes defining an initial circuit configured to operate on an array of qubits, wherein the initial circuit comprises multiple instances of the two-qubit gate, wherein each instance of the two-qubit gate performs a same operation on a respective pair of neighboring qubits in the array; partitioning the initial circuit into multiple layers, wherein instances of the two-qubit gate in a respective layer can be implemented in parallel; for each of the multiple layers: constructing benchmarking circuits for the layer, wherein each benchmarking circuit for the layer comprises one or more cycles of quantum gates, each cycle comprising: the layer of instances of the two-qubit gate, and a plurality of single qubit gates; implementing the constructed benchmarking circuits to obtain experimental benchmarking data; and adjusting control parameters of the control model using the experimental benchmarking data.