Semiconductor light emitting device with contact hole passing through active layer
    1.
    发明授权
    Semiconductor light emitting device with contact hole passing through active layer 有权
    具有穿过有源层的接触孔的半导体发光器件

    公开(公告)号:US08723206B2

    公开(公告)日:2014-05-13

    申请号:US13228977

    申请日:2011-09-09

    IPC分类号: H01L33/00

    摘要: A semiconductor light emitting device has a semiconductor laminate including first and second conductivity type semiconductor layers respectively providing first and second main surfaces and an active layer. The semiconductor laminate is divided into first and second regions. At least one contact hole is formed to pass through the active layer from the second main surface of the first region. A first electrode is formed on the second main surface to be connected to the first conductivity type semiconductor layer of the first region and the second conductivity type semiconductor layer of the second region. A second electrode is formed on the second main surface of the first region to be connected to the second conductivity type semiconductor layer of the first region and the first conductivity type semiconductor layer of the second region.

    摘要翻译: 半导体发光器件具有包括分别提供第一和第二主表面和有源层的第一和第二导电类型半导体层的半导体层叠体。 半导体层叠体被分成第一和第二区域。 形成至少一个接触孔以从第一区域的第二主表面穿过有源层。 第一电极形成在第二主表面上,以连接到第一区域的第一导电类型半导体层和第二区域的第二导电类型半导体层。 在与第一区域的第二导电类型半导体层和第二区域的第一导电类型半导体层连接的第一区域的第二主表面上形成第二电极。

    SEMICONDUCTOR LIGHT EMITTING DEVICE
    2.
    发明申请
    SEMICONDUCTOR LIGHT EMITTING DEVICE 有权
    半导体发光器件

    公开(公告)号:US20130062638A1

    公开(公告)日:2013-03-14

    申请号:US13228977

    申请日:2011-09-09

    IPC分类号: H01L33/58

    摘要: A semiconductor light emitting device has a semiconductor laminate including first and second conductivity type semiconductor layers respectively providing first and second main surfaces and an active layer. The semiconductor laminate is divided into first and second regions. At least one contact hole is formed to pass through the active layer from the second main surface of the first region. A first electrode is formed on the second main surface to be connected to the first conductivity type semiconductor layer of the first region and the second conductivity type semiconductor layer of the second region. A second electrode is formed on the second main surface of the first region to be connected to the second conductivity type semiconductor layer of the first region and the first conductivity type semiconductor layer of the second region.

    摘要翻译: 半导体发光器件具有包括分别提供第一和第二主表面和有源层的第一和第二导电类型半导体层的半导体层叠体。 半导体层叠体被分成第一和第二区域。 形成至少一个接触孔以从第一区域的第二主表面穿过有源层。 第一电极形成在第二主表面上,以连接到第一区域的第一导电类型半导体层和第二区域的第二导电类型半导体层。 在与第一区域的第二导电类型半导体层和第二区域的第一导电类型半导体层连接的第一区域的第二主表面上形成第二电极。

    LED INSPECTION APPARATUS AND LED INSPECTION METHOD USING THE SAME
    3.
    发明申请
    LED INSPECTION APPARATUS AND LED INSPECTION METHOD USING THE SAME 有权
    LED检查装置和使用该检测装置的LED检查方法

    公开(公告)号:US20090136120A1

    公开(公告)日:2009-05-28

    申请号:US12275581

    申请日:2008-11-21

    IPC分类号: G06K9/00

    CPC分类号: G01N21/95 G01N21/956

    摘要: Disclosed are a light emitting diode (LED) inspection apparatus, which can determine whether an LED has a defect such as leakage current, without making physical contact with the LED being inspected, and an LED inspection method thereof. The LED inspection apparatus includes an ultraviolet emission unit emitting UV light to an LED, an image generation unit generating an image of the LED to which the UV light is emitted, and a control unit obtaining color or intensity information of the LED from the image of the LED and determining, based on the color information, whether the LED is defective

    摘要翻译: 公开了一种发光二极管(LED)检查装置及其LED检查方法,其可以确定LED是否具有诸如泄漏电流的缺陷,而不与被检查的LED进行物理接触。 LED检查装置包括向LED发射UV光的紫外线发射单元,产生发出UV光的LED的图像的图像生成单元和从LED的图像获得LED的颜色或强度信息的控制单元 LED并基于颜色信息确定LED是否有缺陷

    LED inspection apparatus and LED inspection method using the same
    4.
    发明授权
    LED inspection apparatus and LED inspection method using the same 有权
    LED检测仪器和LED检测方法使用相同

    公开(公告)号:US08068661B2

    公开(公告)日:2011-11-29

    申请号:US12275581

    申请日:2008-11-21

    IPC分类号: G06K9/00

    CPC分类号: G01N21/95 G01N21/956

    摘要: Disclosed are a light emitting diode (LED) inspection apparatus, which can determine whether an LED has a defect such as leakage current, without making physical contact with the LED being inspected, and an LED inspection method thereof. The LED inspection apparatus includes an ultraviolet emission unit emitting UV light to an LED, an image generation unit generating an image of the LED to which the UV light is emitted, and a control unit obtaining color or intensity information of the LED from the image of the LED and determining, based on the color information, whether the LED is defective.

    摘要翻译: 公开了一种发光二极管(LED)检查装置及其LED检查方法,其可以确定LED是否具有诸如泄漏电流的缺陷,而不与被检查的LED进行物理接触。 LED检查装置包括向LED发射UV光的紫外线发射单元,产生发出UV光的LED的图像的图像生成单元和从LED的图像获得LED的颜色或强度信息的控制单元 LED并基于颜色信息确定LED是否有缺陷。