METHOD FOR ELECTRONICALLY TESTING INTEGRITY OF IDEAL DIODE COMPONENTS USED IN OR'D VOLTAGE BUS
    1.
    发明申请
    METHOD FOR ELECTRONICALLY TESTING INTEGRITY OF IDEAL DIODE COMPONENTS USED IN OR'D VOLTAGE BUS 有权
    用于电子测试在ORD电压总线中使用的理想二极管组件的完整性的方法

    公开(公告)号:US20160274195A1

    公开(公告)日:2016-09-22

    申请号:US14663250

    申请日:2015-03-19

    CPC classification number: G01R31/40 H02M3/158

    Abstract: A power system includes a first power input, a second power input, a power output, a first ideal diode coupled to the a power input and a power output and a second ideal diode coupled to a second power input and the power output. The power system also includes a first switching circuit coupled to the first power input and the first ideal diode and a second switching circuit coupled to the second power input and the second ideal diode, the switching circuits operating as an open or a short circuit based on an input. The power system also includes a test controller coupled to the first switching circuit, the second switching circuit and the power output and configured to determine an operating status of the power system based on an input to the first switch, inputs to the second switch and the power output.

    Abstract translation: 电力系统包括第一电力输入,第二电力输入,电力输出,耦合到电力输入的第一理想二极管和功率输出以及耦合到第二电力输入和功率输出的第二理想二极管。 电力系统还包括耦合到第一电力输入端和第一理想二极管的第一开关电路和耦合到第二电力输入端和第二理想二极管的第二开关电路,开关电路作为开路或短路工作,基于 一个输入 电力系统还包括耦合到第一开关电路,第二开关电路和电力输出的测试控制器,并且被配置为基于对第一开关的输入来确定电力系统的运行状态,输入到第二开关和 功率输出。

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