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公开(公告)号：US20250068546A1
公开(公告)日：2025-02-27
申请号：US18452599
申请日：2023-08-21
Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Inventor： Rahul Bahal , Derwin Thulani Ngomane , Laura Lee Richter
Abstract: In some examples, different time offsets within a test time interval are computed for tests by respective sensors of a plurality of sensors, where a time offset of the different offsets indicates a point in time within the test time interval with respect to which a corresponding sensor is to initiate a test. A sensor of the plurality of sensors performs tests according to a corresponding time offset of the different time offsets.
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