公开(公告)号：US20220101516A1

公开(公告)日：2022-03-31

申请号：US17485638

申请日：2021-09-27

申请人： HIVE VISION CO., LTD.

发明人： In Soo KWEON ,  Yeo Hak YOON ,  Ung Jun CHUN ,  Su Yeol PARK

IPC分类号： G06T7/00 ,  G06T7/586 ,  G06T7/33 ,  G06T7/35 ,  G06T7/60

摘要： A non-Lambertian surface inspection system for line scan is proposed. Such a system includes: a surface inspection part including a frame module provided with a curved mounting hole formed on at least one of one surface and the other surface thereof and a photographing hole formed at an upper end thereof, and a plurality of first and second illumination modules installed in the mounting hole and output light in oblique lines toward an inspection object placed on a bottom surface thereof; a camera part positioned above the photographing hole, and configured to photograph the inspection object positioned on the bottom surface through the photographing hole and receive an entire reception image including first and second illumination images; and a controller configured to control operation of the camera part, selectively operate the first illumination module and the second illumination module, and extract the first illumination image and the second illumination image.