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公开(公告)号:US20230367913A1
公开(公告)日:2023-11-16
申请号:US18356463
申请日:2023-07-21
Applicant: HUAWEI TECHNOLOGIES CO., LTD.
Inventor: Jianwei JIA , Feifei YIN , Gang FENG , Yu LIU
CPC classification number: G06F21/64 , G06F21/575 , G06F2221/034
Abstract: The present disclosure relates to a terminal chip and a measurement method thereof. In an example, a terminal chip includes a computing subsystem and a security subsystem. The security subsystem is configured to measure the computing subsystem. A boot time of the security subsystem is earlier than a boot time of the computing subsystem. The security subsystem includes an integrity verification unit configured to perform integrity measurement on data in a boot process of the computing subsystem.