公开(公告)号：US20240241808A1

公开(公告)日：2024-07-18

申请号：US18616076

申请日：2024-03-25

Applicant: HUAWEI TECHNOLOGIES CO., LTD.

Inventor： Fuchun Wei ,  Yongzhong Wang ,  Yayun Ji ,  Zhongqing Ouyang

IPC: G06F11/34

CPC classification number: G06F11/3466

Abstract: In an application performance testing method, a testing device obtains running status data of an application running on a computing chip and a memory access volume of each data access path of the computing chip in a running process of the application. The computing chip includes a plurality of memory units, and the data access path represents an access path between the memory units. The testing device determines running performance information of the application based on the running status data and the memory access volume of each data access path, and obtains a test result of the application based on the running performance information of the application and a performance test model established for the computing chip. The performance test model includes a performance test line of each data access path.