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公开(公告)号：US09965844B1
公开(公告)日：2018-05-08
申请号：US15250184
申请日：2016-08-29
发明人： Wei Fang , Zhao-Li Zhang , Jack Jau
CPC分类号： G06T7/0004 , G06K9/4671 , G06T2207/10061 , G06T2207/30148
摘要： An inspection method includes the following steps: identifying a plurality of patterns within an image; and comparing the plurality of patterns with each other for measurement values thereof. The above-mentioned inspection method uses the pattern within the image as a basis for comparison; therefore, measurement values of the plurality of pixels constructing the pattern can be processed with statistical methods and then compared, and the false rate caused by variation of a few pixels is decreased significantly. An inspection system implementing the above-mentioned method is also disclosed.
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公开(公告)号：US10102619B1
公开(公告)日：2018-10-16
申请号：US14738791
申请日：2015-06-12
发明人： Wei Fang , Zhao-Li Zhang , Jack Jau
摘要： An inspection method includes the following steps: identifying a plurality of patterns within an image; and comparing the plurality of patterns with each other for measurement values thereof. The above-mentioned inspection method uses the pattern within the image as a basis for comparison; therefore, measurement values of the plurality of pixels constructing the pattern can be processed with statistical methods and then compared, and the false rate caused by variation of a few pixels is decreased significantly. An inspection system implementing the above-mentioned method is also disclosed.
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