公开(公告)号：US11221942B2

公开(公告)日：2022-01-11

申请号：US16820615

申请日：2020-03-16

Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP

Inventor： Pavan Sridhar ,  Deepak Panambur ,  Rohith Panambur

IPC: G06F11/00 ,  G06F11/36 ,  G06F11/34 ,  G06N20/00

Abstract: Systems and methods provided for a software test automation platform including an artificial intelligence (AO/machine learning (ML) test analyzer. The AI/ML test analyzer can be a computer device operating with the software testing automation platform that is programmed to obtain run-time data from executing multiple software test cases for a software workload; obtain log data from the one or more test logs, relating to previous executions of the tests cases for the software workload. The AI/ML test analyzer can then analyze the log data and the run-time data by applying ML/AI tools, concurrently with executing the test cases, for recognizing patterns associated with the executed tests cases over a period of time, and automatically predicting an optimized set of test cases and analytics related to execution of the test cases for the software workload.

公开(公告)号：US20210034506A1

公开(公告)日：2021-02-04

申请号：US16527233

申请日：2019-07-31

Applicant: Hewlett Packard Enterprise Development LP

Inventor： Pavan Sridhar ,  Deepak Panambur ,  Rohith Panambur

IPC: G06F11/36

Abstract: Examples described relate to examples for testing a computer program. In an example, a first set of factors to be considered in a first test plan for testing a computer program may be selected. A first set of test data may be assigned to the first set of factors. A first test may be performed on the computer program, based on the first set of factors, considering the first set of test data. The first test results obtained in response to performing the first test on the computer program may be analyzed. In response to analyzing the first test results, at least one of the first test plan, the first set of factors, and the first set of test data for testing the computer program may be updated.

公开(公告)号：US20200341888A1

公开(公告)日：2020-10-29

申请号：US16820615

申请日：2020-03-16

Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP

Inventor： Pavan Sridhar ,  Deepak Panambur ,  Rohith Panambur

IPC: G06F11/36 ,  G06N20/00 ,  G06F11/34

Abstract: Systems and methods provided for a software test automation platform including an artificial intelligence (AO/machine learning (ML) test analyzer. The AI/ML test analyzer can be a computer device operating with the software testing automation platform that is programmed to obtain run-time data from executing multiple software test cases for a software workload; obtain log data from the one or more test logs, relating to previous executions of the tests cases for the software workload. The AI/ML test analyzer can then analyze the log data and the run-time data by applying ML/AI tools, concurrently with executing the test cases, for recognizing patterns associated with the executed tests cases over a period of time, and automatically predicting an optimized set of test cases and analytics related to execution of the test cases for the software workload.